NXP Semiconductors PF5030 Fail-Safe System Basis Chip PMICs

发布时间：2023-04-26 11:35
作者：AMEYA360
来源：网络
阅读量：1178

　　NXP Semiconductor PF5030 Fail-Safe System Basis Chip PMICs with multiple switch-mode power supplies (SMPSs) and low-dropout regulators (LDOs) are designed for S32Z2/E2 processors. A maximum input voltage of up to 5.25V makes the PF5030 PMICs ideal for working with NXP front system supply families (FS86, FS6x) or any other front supply in the automotive drive train market. 

NXP Semiconductors PF5030 Fail-Safe System Basis Chip PMICs

      Built-in One-Time Programmable (OTP) memory stores key start-up configurations that drastically reduce external components typically used to set external regulators' output voltage and sequence. Regulator parameters are adjustable through the I2C after start-up, offering flexibility for different system states.

　　FEATURES

　　Voltage

　　5.25VDC maximum operating voltage

　　Supports operating voltage range down to 3.3V

　　Low power OFF mode with low sleep current (15?A typical)

　　Power supplies

　　BUCK1/2 low voltage integrated synchronous buck converter

　　Configurable output voltage from 0.7V to 1.5V and current capability up to 3.5ADC

　　Capable of multiphase operation up to 7.0ADC

　　BUCK3 low voltage integrated synchronous buck converter

　　Configurable output voltage from 1.0V to 4.1V and current capability up to 2.5ADC

　　LDO1/2 low voltage LDO regulator for MCU I/O and system peripheral

　　Configurable output voltage from 1.1V to 4.1V and current capability up to 400mADC

　　System support

　　1x input pin for power-ON detection, 1.8V, 3.3V, and 5.0V compatible

　　Analog multiplexer with full system voltages and temperature monitoring

　　Enhanced leader/follower power-up sequencing management through XFAILB pin

　　10ms optional RSTB release delay during power-up for certain MCU compliance

　　Device control via 32-bit I2C interface with 8-bit CRC

　　Compliance

　　EMC optimization techniques on switching regulators, including spread spectrum and manual frequency tuning

　　EMI robustness supporting various automotive EMI test standards

　　IEC 61967-4 conducted emission

　　IEC 62132-4 conducted immunity

　　Functional safety

　　ASIL D capability on safety goal 1 (SG1/CSG_01) on UV/OV for all S32Z2/E2 power rails (0.8V, 1.1V, 1.8V, and 3.3V)

　　Configurable ASIL from QM to ASIL D on safety goal 2 (SG2/CSG_02) on MCU monitoring function (watchdog)

　　Independent voltage monitoring circuitry

　　Up to 6x voltage monitoring inputs with 1.0% target accuracy

　　Logical and analog built-in self-test (LBIST/ABIST)

　　Safety outputs with latent fault detection mechanism (PGOOD, RSTB, FS0B)

　　Configuration and enablement

　　40-pin QFN with exposed pad for optimized thermal management

　　OTP programming for device customization

　　APPLICATIONS

　　EV propulsion and power train domain controllers

　　Chassis-integrated systems

　　S32Z2/E2 companion chips


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